Publication:

GaN-based HEMTs tested under high temperature storage test

Date

2011

Journal article

https://doi.org/10.1016/

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Author(s)

;

;

;

Van Hove, Marleen

;

Srivastava, Puneet

;

Decoutere, Stefaan

;

Mertens, Robert

;

Borghs, Gustaaf

Journal

Microelectronics Reliability

Metrics

2010 since deposited on 2021-10-19

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Acq. date: 2026-01-11