Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Influence of back-gate bias and process conditions on the gamma degradation of the transconductance of MuGFETs
Publication:
Influence of back-gate bias and process conditions on the gamma degradation of the transconductance of MuGFETs
Date
2010
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
21199.pdf
987.49 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Put, Sofie
;
Simoen, Eddy
;
Collaert, Nadine
;
De Keersgieter, An
;
Claeys, Cor
;
Van Uffelen, Marco
;
Leroux, Paul
Journal
IEEE Transactions on Nuclear Science
Abstract
Description
Metrics
Views
1876
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1876
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations