Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory
Publication:
Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory
Copy permalink
Date
2013
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahid, Mohammed
;
Degraeve, Robin
;
Breuil, Laurent
;
Van den Bosch, Geert
;
Van Houdt, Jan
Journal
Abstract
Description
Metrics
Views
1788
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1788
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-15
Citations