Publication:
Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory
Date
| dc.contributor.author | Zahid, Mohammed | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Breuil, Laurent | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Breuil, Laurent | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Breuil, Laurent::0000-0003-2869-1651 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-21T14:56:12Z | |
| dc.date.available | 2021-10-21T14:56:12Z | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23429 | |
| dc.source.beginpage | MY.6 | |
| dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
| dc.source.conferencedate | 16/04/2013 | |
| dc.source.conferencelocation | Monterey, CA USA | |
| dc.title | Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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