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Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
Publication:
Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lanza, Mario
;
Celano, Umberto
;
Feng, Miao.Innovation Center of Adva
Journal
Journal of Electroceramics
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1883
since deposited on 2021-10-24
Acq. date: 2025-12-16
Citations
Metrics
Views
1883
since deposited on 2021-10-24
Acq. date: 2025-12-16
Citations