Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups

dc.contributor.author	Lanza, Mario
dc.contributor.author	Celano, Umberto
dc.contributor.author	Feng, Miao.Innovation Center of Adva
dc.contributor.imecauthor	Celano, Umberto
dc.contributor.orcidimec	Celano, Umberto::0000-0002-2856-3847
dc.date.accessioned	2021-10-24T07:26:45Z
dc.date.available	2021-10-24T07:26:45Z
dc.date.embargo	9999-12-31
dc.date.issued	2017
dc.identifier.issn	1385-3449
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/28752
dc.identifier.url	https://link.springer.com/article/10.1007/s10832-017-0082-1
dc.source.beginpage	94
dc.source.endpage	108
dc.source.issue	1_4
dc.source.journal	Journal of Electroceramics
dc.source.volume	39
dc.title	Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
dc.type	Journal article
dspace.entity.type	Publication
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