Impact of device scaling on the electrical properties of MoS2 field-effect transistors

Arutchelvan, Goutham; Smets, Quentin; Verreck, Devin; Ahmed, Zubair; Gaur, Abhinav; Sutar, Surajit; Jussot, Julien; Groven, Benjamin; Heyns, Marc; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana

doi:10.1038/s41598-021-85968-y

Publication:

Impact of device scaling on the electrical properties of MoS2 field-effect transistors

Date

2021

Journal article

https://doi.org/10.1038/s41598-021-85968-y

Simple item page Full metadata Statistics

Files

Published version 1.99 MB

Author(s)

;

;

;

;

;

;

;

;

;

;

;

Journal

SCIENTIFIC REPORTS

Statistics

676 since deposited on 2022-02-24

60last month

20last week

Acq. date: 2026-04-26

1934 since deposited on 2022-02-24

1last month

Acq. date: 2026-04-26

Impact of device scaling on the electrical properties of MoS2 field-effect transistors

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations