Impact of device scaling on the electrical properties of MoS2 field-effect transistors

Arutchelvan, Goutham; Smets, Quentin; Verreck, Devin; Ahmed, Zubair; Gaur, Abhinav; Sutar, Surajit; Jussot, Julien; Groven, Benjamin; Heyns, Marc; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana

doi:10.1038/s41598-021-85968-y

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Impact of device scaling on the electrical properties of MoS2 field-effect transistors

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2021

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https://doi.org/10.1038/s41598-021-85968-y

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SCIENTIFIC REPORTS

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717 since deposited on 2022-02-24

Acq. date: 2026-06-21

1936 since deposited on 2022-02-24

Acq. date: 2026-06-21

Impact of device scaling on the electrical properties of MoS2 field-effect transistors

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