Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors

Simple item page Full metadata Statistics

Author(s)

Vincent, Benjamin

;

;

;

;

Demeulemeester, J.

;

;

Clarysse, Trudo

;

Vantomme, Andre

;

;

;

Dekoster, Johan

;

;

Metrics

1932 since deposited on 2021-10-19

Acq. date: 2025-10-23