Publication:

Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors

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1940 since deposited on 2021-10-19
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Acq. date: 2026-04-28

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1940 since deposited on 2021-10-19
1last month
1last week
Acq. date: 2026-04-28

Citations