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Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Publication:
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahid, Mohammed
;
Degraeve, Robin
;
Tang, Baojun
;
Lisoni, Judit
;
Van den Bosch, Geert
;
Van Houdt, Jan
;
Breuil, Laurent
;
Blomme, Pieter
;
Arreghini, Antonio
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1902
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1902
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations