Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Publication:
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Copy permalink
Date
2014
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahid, Mohammed
;
Degraeve, Robin
;
Tang, Baojun
;
Lisoni, Judit
;
Van den Bosch, Geert
;
Van Houdt, Jan
;
Breuil, Laurent
;
Blomme, Pieter
;
Arreghini, Antonio
Journal
Abstract
Description
Metrics
Views
1904
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations
Metrics
Views
1904
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations