Publication:
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Date
| dc.contributor.author | Zahid, Mohammed | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Tang, Baojun | |
| dc.contributor.author | Lisoni, Judit | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | Breuil, Laurent | |
| dc.contributor.author | Blomme, Pieter | |
| dc.contributor.author | Arreghini, Antonio | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | Breuil, Laurent | |
| dc.contributor.imecauthor | Blomme, Pieter | |
| dc.contributor.imecauthor | Arreghini, Antonio | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.contributor.orcidimec | Breuil, Laurent::0000-0003-2869-1651 | |
| dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
| dc.date.accessioned | 2021-10-22T08:49:55Z | |
| dc.date.available | 2021-10-22T08:49:55Z | |
| dc.date.issued | 2014 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24876 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6860601&contentType=Conference+Publications | |
| dc.source.beginpage | 2E-3.1 | |
| dc.source.conference | International Reliability Physics Symposium - IRPS | |
| dc.source.conferencedate | 1/06/2014 | |
| dc.source.conferencelocation | Waikoloa, HI USA | |
| dc.source.endpage | 2E-3.5 | |
| dc.title | Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |