Publication:

Reliability of SiGe Channel MOS

Date

2012
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

24795.pdf 920.11 KB

Author(s)

Franco, Jacopo  
;
Kaczer, Ben  
;
Mitard, Jerome  
;
Toledano Luque, Maria
;
Eneman, Geert  
;
Roussel, Philippe  
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Witters, Liesbeth  
;
Hikavyy, Andriy  
;
Hellings, Geert  
;
Ragnarsson, Lars-Ake  
;
Horiguchi, Naoto  
;
Grasser, T.
;
Heyns, Marc  
;
Groeseneken, Guido  

Journal

Abstract

Description

Metrics

Downloads

1 since deposited on 2021-10-20
Acq. date: 2025-12-15

Views

1879 since deposited on 2021-10-20
Acq. date: 2025-12-15

Citations

Metrics

Downloads

1 since deposited on 2021-10-20
Acq. date: 2025-12-15

Views

1879 since deposited on 2021-10-20
Acq. date: 2025-12-15

Citations