Publication:

ESD study on a-IGZO TFT device architectures

Date

2018-10-28

Proceedings Paper

https://doi.org/10.23919/EOS/ESD.2018.8509748

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Files

Accepted version 1.17 MB

Author(s)

;

Hellings, Geert

;

Chen, Shih-Hung

;

;

Linten, Dimitri

Journal

na

Statistics

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Acq. date: 2026-04-06