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Electrical resistance measurements of individual nanometer-wide Si fins
Publication:
Electrical resistance measurements of individual nanometer-wide Si fins
Date
2017
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Folkersma, Steven
;
Bogdanowicz, Janusz
;
Schulze, Andreas
;
Petersen, D.H.
;
Hansen, O.
;
Henrichsen, H.
;
Nielsen, P.F.
;
Vandervorst, Wilfried
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1880
since deposited on 2021-10-24
Acq. date: 2025-10-26
Citations
Metrics
Views
1880
since deposited on 2021-10-24
Acq. date: 2025-10-26
Citations