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High-k characterization by RFCV
Publication:
High-k characterization by RFCV
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Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
San Andres Serrano, Enrique
;
Pantisano, Luigi
;
Roussel, Philippe
;
Toledano Luque, Maria
;
Trojman, Lionel
;
Severi, Simone
;
De Gendt, Stefan
;
Groeseneken, Guido
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2
since deposited on 2021-10-16
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1912
since deposited on 2021-10-16
1
last month
1
last week
Acq. date: 2026-01-26
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