Characterisation of the DARE180U MOSFET Channel Geometry TID Radiation Sensitivity

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Author(s)

Jansen, R. J. E.

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;

Boatella-Polo, C.

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;

Verhaegen, Shane

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Franciscatto, Giancarlo

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Lambrichts, Danny

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Vargas-Sierra, S.

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Gonzalez Lujan, J. J.

Journal

na

Metrics

1480 since deposited on 2022-10-06

Acq. date: 2025-10-23