Publication:
Record Ion/Ioff performance for 65nm Ge pMOSFET and novel Si passivation scheme for improved EOT scalability
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1873 since deposited on 2021-10-17
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Acq. date: 2026-03-17
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Statistics
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1873 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-03-17
Citations