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On the electrical characterization of grain boundaries in multicrystalline silicon
Publication:
On the electrical characterization of grain boundaries in multicrystalline silicon
Date
2010
Meeting abstract
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22052.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Jiahe
;
Cornagliotti, Emanuele
;
Hieckmann, Ellen
;
Behrendt, Simone
;
Weber, Joerg
;
Simoen, Eddy
;
Poortmans, Jef
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1915
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1915
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations