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On the electrical characterization of grain boundaries in multicrystalline silicon

Date

2010
Meeting abstract
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dc.contributor.authorChen, Jiahe
dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorHieckmann, Ellen
dc.contributor.authorBehrendt, Simone
dc.contributor.authorWeber, Joerg
dc.contributor.authorSimoen, Eddy
dc.contributor.authorPoortmans, Jef
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-18T15:32:30Z
dc.date.available2021-10-18T15:32:30Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16848
dc.source.beginpage1675
dc.source.conference218th ECS Meeting: Photovoltaics for the 21st Century
dc.source.conferencedate10/10/2010
dc.source.conferencelocationLas Vegas, NV USA
dc.title

On the electrical characterization of grain boundaries in multicrystalline silicon

dc.typeMeeting abstract
dspace.entity.typePublication
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