Publication:
Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
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1926 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-01
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Views
1926 since deposited on 2021-10-22
1last month
Acq. date: 2026-05-01
Citations