Publication:
Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs
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1832 since deposited on 2021-10-16
Acq. date: 2025-12-15
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Views
1832 since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations