Publication:
Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs
Date
| dc.contributor.author | Rafi, J.M. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Canmpabadal, F. | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.date.accessioned | 2021-10-16T04:21:26Z | |
| dc.date.available | 2021-10-16T04:21:26Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11073 | |
| dc.source.beginpage | 1536 | |
| dc.source.endpage | 1546 | |
| dc.source.issue | 5 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 49 | |
| dc.title | Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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