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Observation of single interface traps in submicron MOSFET's by charge pumping
Publication:
Observation of single interface traps in submicron MOSFET's by charge pumping
Date
1996
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
De Wolf, Ingrid
;
Bellens, Rudi
;
Maes, Herman
Journal
IEEE Transactions on Electron Devices
Abstract
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1995
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1995
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations