Observation of single interface traps in submicron MOSFET's by charge pumping

dc.contributor.author	Groeseneken, Guido
dc.contributor.author	De Wolf, Ingrid
dc.contributor.author	Bellens, Rudi
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.imecauthor	De Wolf, Ingrid
dc.date.accessioned	2021-09-29T14:31:24Z
dc.date.available	2021-09-29T14:31:24Z
dc.date.embargo	9999-12-31
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1240
dc.source.beginpage	940
dc.source.endpage	945
dc.source.issue	6
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	43
dc.title	Observation of single interface traps in submicron MOSFET's by charge pumping
dc.type	Journal article
dspace.entity.type	Publication
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