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On the calculation of gate tunneling currents in ultra-thin metal-insulator-semiconductor capacitors
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On the calculation of gate tunneling currents in ultra-thin metal-insulator-semiconductor capacitors
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Magnus, Wim
;
Schoenmaker, Wim
Journal
Microelectronics Reliability
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1846
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1846
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations