Publication:
On the calculation of gate tunneling currents in ultra-thin metal-insulator-semiconductor capacitors
Date
| dc.contributor.author | Magnus, Wim | |
| dc.contributor.author | Schoenmaker, Wim | |
| dc.contributor.imecauthor | Magnus, Wim | |
| dc.date.accessioned | 2021-10-14T17:18:50Z | |
| dc.date.available | 2021-10-14T17:18:50Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5466 | |
| dc.source.beginpage | 31 | |
| dc.source.endpage | 35 | |
| dc.source.issue | 1 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 41 | |
| dc.title | On the calculation of gate tunneling currents in ultra-thin metal-insulator-semiconductor capacitors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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