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Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology
Publication:
Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology
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Date
2021
Proceedings Paper
https://doi.org/10.1109/NSREC45046.2021.9679337
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Artola, L.
;
Nuns, T.
;
Cussac, G.
;
Chiarella, Thomas
;
Mitard, Jerome
Journal
na
Abstract
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1700
since deposited on 2022-06-25
Acq. date: 2025-12-16
Citations
Metrics
Views
1700
since deposited on 2022-06-25
Acq. date: 2025-12-16
Citations