Publication:
Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology
| dc.contributor.author | Artola, L. | |
| dc.contributor.author | Nuns, T. | |
| dc.contributor.author | Cussac, G. | |
| dc.contributor.author | Chiarella, Thomas | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.imecauthor | Chiarella, Thomas | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.orcidimec | Chiarella, Thomas::0000-0002-6155-9030 | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.date.accessioned | 2022-06-28T08:05:50Z | |
| dc.date.available | 2022-06-25T02:28:42Z | |
| dc.date.available | 2022-06-28T08:05:50Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/NSREC45046.2021.9679337 | |
| dc.identifier.eisbn | 978-1-6654-4205-3 | |
| dc.identifier.issn | 2154-0519 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40023 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 118 | |
| dc.source.conference | IEEE Nuclear and Space Radiation Effects Conference (NSREC) / IEEE Radiation Effects Data Workshop (REDW) | |
| dc.source.conferencedate | JUL 17-23, 2021 | |
| dc.source.conferencelocation | na | |
| dc.source.endpage | 124 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 7 | |
| dc.subject.keywords | VARIABILITY | |
| dc.title | Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |