Comparison of current mirrors designed with TFET and FinFET devices for different dimensions and temperatures

dc.contributor.author	Martino, M.D.V.
dc.contributor.author	Martino, J.A.
dc.contributor.author	Agopian, P.G.D.
dc.contributor.author	Vandooren, Anne
dc.contributor.author	Rooyackers, Rita
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Thean, Aaron
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Vandooren, Anne
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	Thean, Aaron
dc.contributor.orcidimec	Vandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-22T20:58:21Z
dc.date.available	2021-10-22T20:58:21Z
dc.date.issued	2015
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/25625
dc.identifier.url	http://ecst.ecsdl.org/content/66/5/303.abstract
dc.source.beginpage	303
dc.source.conference	Advanced CMOS-Compatible Semiconductor Devices 17
dc.source.conferencedate	24/05/2015
dc.source.conferencelocation	Chicago, IL USA
dc.source.endpage	308
dc.title	Comparison of current mirrors designed with TFET and FinFET devices for different dimensions and temperatures
dc.type	Proceedings paper
dspace.entity.type	Publication
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