Publication:
Full (Vg,Vd) bias space modeling of hot-carrier degradation in nanowire FETs
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1974 since deposited on 2021-10-27
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Acq. date: 2026-01-26
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1974 since deposited on 2021-10-27
1last month
1last week
Acq. date: 2026-01-26
Citations