Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Characterization of the post dry etch cleaning of the silicon surface prior to silicon epitaxial growth
Publication:
Characterization of the post dry etch cleaning of the silicon surface prior to silicon epitaxial growth
Date
1999
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
3523.pdf
592.52 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Young-Chang
;
Caymax, Matty
;
Bender, Hugo
;
Vanhaelemeersch, Serge
Journal
Abstract
Description
Metrics
Views
1892
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations
Metrics
Views
1892
since deposited on 2021-10-06
Acq. date: 2025-10-23
Citations