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Conference contributions
Charge trapping in SiO2/HfO2 dual layer gate stacks
Publication:
Charge trapping in SiO2/HfO2 dual layer gate stacks
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cartier, E.
;
Kerber, A.
;
Pantisano, Luigi
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Abstract
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1949
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Acq. date: 2025-12-09
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Views
1949
since deposited on 2021-10-15
1
last month
1
last week
Acq. date: 2025-12-09
Citations