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A new method for measuring the saturation velocity of submicron CMOS transistors
Publication:
A new method for measuring the saturation velocity of submicron CMOS transistors
Date
1995
Journal article
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834.pdf
195.71 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schreutelkamp, Rob
;
Deferm, Ludo
Journal
Solid State Electronics
Abstract
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1977
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1977
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations