Publication:

A new method for measuring the saturation velocity of submicron CMOS transistors

Date

1995
Journal article
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dc.contributor.authorSchreutelkamp, Rob
dc.contributor.authorDeferm, Ludo
dc.contributor.imecauthorDeferm, Ludo
dc.date.accessioned2021-09-29T13:16:17Z
dc.date.available2021-09-29T13:16:17Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/859
dc.source.beginpage791
dc.source.endpage793
dc.source.issue4
dc.source.journalSolid State Electronics
dc.source.volume38
dc.title

A new method for measuring the saturation velocity of submicron CMOS transistors

dc.typeJournal article
dspace.entity.typePublication
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