Publication:
Channel length and oxide thickness scaling effects on low-frequency (1/f) noise in metal/high-k sub-micron MOSFETs
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1846 since deposited on 2021-10-16
Acq. date: 2025-12-11
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Views
1846 since deposited on 2021-10-16
Acq. date: 2025-12-11
Citations