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Channel length and oxide thickness scaling effects on low-frequency (1/f) noise in metal/high-k sub-micron MOSFETs
Publication:
Channel length and oxide thickness scaling effects on low-frequency (1/f) noise in metal/high-k sub-micron MOSFETs
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Srinivasan, Purushothaman
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
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1845
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1845
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations