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A ballistic electron emission microscopy (BEEM)-investigation of the effects of reactive ion etching (RIE) and of chemical pretreatment on III-V semiconductors
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1927 since deposited on 2021-09-30
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Acq. date: 2026-10-06
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Statistics
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1927 since deposited on 2021-09-30
2last month
2last week
Acq. date: 2026-10-06
Citations