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Statistical investigation of the floating gate memory cell leakage through high-k interpoly dielectrics and its impact on scalability and reliability

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1785 since deposited on 2021-10-17
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Acq. date: 2026-10-07

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1785 since deposited on 2021-10-17
2last month
2last week
Acq. date: 2026-10-07

Citations