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Substrate noise isolation experiments in a 0.18μm 1P6M triple-well CMOS process on a lightly doped substrate
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Substrate noise isolation experiments in a 0.18μm 1P6M triple-well CMOS process on a lightly doped substrate
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vinella, Rosa Maria
;
Van der Plas, Geert
;
Soens, Charlotte
;
Rizzi, Maria
;
Castagnolo, Beniamino
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1858
since deposited on 2021-10-16
Acq. date: 2026-07-15
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Views
1858
since deposited on 2021-10-16
Acq. date: 2026-07-15
Citations