Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Substrate noise isolation experiments in a 0.18μm 1P6M triple-well CMOS process on a lightly doped substrate
Publication:
Substrate noise isolation experiments in a 0.18μm 1P6M triple-well CMOS process on a lightly doped substrate
Copy permalink
Date
2007-05
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vinella, Rosa Maria
;
Van der Plas, Geert
;
Soens, Charlotte
;
Rizzi, Maria
;
Castagnolo, Beniamino
Journal
Abstract
Description
Metrics
Views
1855
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations
Metrics
Views
1855
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations