Publication:
Substrate noise isolation experiments in a 0.18μm 1P6M triple-well CMOS process on a lightly doped substrate
Date
| dc.contributor.author | Vinella, Rosa Maria | |
| dc.contributor.author | Van der Plas, Geert | |
| dc.contributor.author | Soens, Charlotte | |
| dc.contributor.author | Rizzi, Maria | |
| dc.contributor.author | Castagnolo, Beniamino | |
| dc.contributor.imecauthor | Van der Plas, Geert | |
| dc.contributor.imecauthor | Soens, Charlotte | |
| dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
| dc.date.accessioned | 2021-10-16T21:29:37Z | |
| dc.date.available | 2021-10-16T21:29:37Z | |
| dc.date.issued | 2007-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13190 | |
| dc.source.conference | Proceedings IEEE Instrumentation and Measurement Conference - IMTC | |
| dc.source.conferencedate | 1/05/2007 | |
| dc.source.conferencelocation | Warsaw Poland | |
| dc.title | Substrate noise isolation experiments in a 0.18μm 1P6M triple-well CMOS process on a lightly doped substrate | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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