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Record mobility (μeff ~3100 cm²/V-s) and reliability performance (Vov~0.5V for 10yr operation) of In0.53Ga0.47As MOS devices using improved surface preparation and a novel interfacial layer
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Acq. date: 2026-04-07
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1 since deposited on 2021-10-23
Acq. date: 2026-04-07
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2015 since deposited on 2021-10-23
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Acq. date: 2026-04-07
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