Publication:

Record mobility (μeff ~3100 cm²/V-s) and reliability performance (Vov~0.5V for 10yr operation) of In0.53Ga0.47As MOS devices using improved surface preparation and a novel interfacial layer

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Downloads

1 since deposited on 2021-10-23
Acq. date: 2025-10-23

Views

2010 since deposited on 2021-10-23
Acq. date: 2025-10-23

Citations

Metrics

Downloads

1 since deposited on 2021-10-23
Acq. date: 2025-10-23

Views

2010 since deposited on 2021-10-23
Acq. date: 2025-10-23

Citations