Publication:

3D-printed optical probes for wafer-level testing of photonic integrated circuits

Date

2020
Journal article
https://doi.org/10.1364/oe.405139
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3D-printed_optical_probes_for_wafer-level_testing_of_photonic_integrated_circuits 2.81 MB

Author(s)

Trappen, Mareike
;
Blaicher, Matthias
;
Dietrich, Philipp-Immanuel
;
Dankwart, Colin
;
Xu, Yilin
;
Hoose, Tobias
;
Billah, Muhammad Rodlin
;
Abbasi, Amin  
;
Baets, Roel  
;
Troppenz, Ute
;
Theurer, Michael
;
Woerhoff, Kerstin
;
Seyfried, Moritz
;
Freude, Wolfgang
;
Koos, Christian

Journal

OPTICS EXPRESS

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280 since deposited on 2021-11-02
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Acq. date: 2026-07-19

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