Publication:

3D-printed optical probes for wafer-level testing of photonic integrated circuits

Date

2020
Journal article
https://doi.org/10.1364/OE.405139
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dc.contributor.authorTrappen, Mareike
dc.contributor.authorBlaicher, Matthias
dc.contributor.authorDietrich, Philipp-Immanuel
dc.contributor.authorDankwart, Colin
dc.contributor.authorXu, Yilin
dc.contributor.authorHoose, Tobias
dc.contributor.authorBillah, Muhammad Rodlin
dc.contributor.authorAbbasi, Amin
dc.contributor.authorBaets, Roel
dc.contributor.authorTroppenz, Ute
dc.contributor.authorTheurer, Michael
dc.contributor.authorWoerhoff, Kerstin
dc.contributor.authorSeyfried, Moritz
dc.contributor.authorFreude, Wolfgang
dc.contributor.authorKoos, Christian
dc.contributor.imecauthorAbbasi, Amin
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.date.accessioned2022-01-03T10:21:58Z
dc.date.available2021-11-02T16:06:29Z
dc.date.available2022-01-03T10:21:58Z
dc.date.issued2020
dc.identifier.doi10.1364/OE.405139
dc.identifier.issn1094-4087
dc.identifier.pmidMEDLINE:33379622
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38277
dc.publisherOPTICAL SOC AMER
dc.source.beginpage37996
dc.source.endpage38007
dc.source.issue25
dc.source.journalOPTICS EXPRESS
dc.source.numberofpages12
dc.source.volume28
dc.title

3D-printed optical probes for wafer-level testing of photonic integrated circuits

dc.typeJournal article
dspace.entity.typePublication
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