Publication:
Vertical III-V gate-all-around nanowire MOSFETs: Process integration and contact resistance study
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
2000 since deposited on 2021-10-29
2last month
1last week
Acq. date: 2025-12-15
Citations
Metrics
Views
2000 since deposited on 2021-10-29
2last month
1last week
Acq. date: 2025-12-15
Citations