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Extraction of the appropriate material property for realistic modeling of through-silicon-vias using μ-raman spectroscopy
Publication:
Extraction of the appropriate material property for realistic modeling of through-silicon-vias using μ-raman spectroscopy
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Okoro, Chukwudi
;
Yang, Yu
;
Vandevelde, Bart
;
Swinnen, Bart
;
Vandepitte, Dirk
;
Verlinden, Bert
;
De Wolf, Ingrid
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1949
since deposited on 2021-10-17
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1949
since deposited on 2021-10-17
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations