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An inner gate as enabler for vertical pitch scaling in macaroni channel gate-all-around 3-D NAND flash memory
Publication:
An inner gate as enabler for vertical pitch scaling in macaroni channel gate-all-around 3-D NAND flash memory
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Date
2023
Journal article
https://doi.org/10.1016/j.sse.2022.108498
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verreck, Devin
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
Journal
SOLID-STATE ELECTRONICS
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1247
since deposited on 2023-01-23
Acq. date: 2025-12-10
Citations
Metrics
Views
1247
since deposited on 2023-01-23
Acq. date: 2025-12-10
Citations