Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Stress characteritzation of selective epitaxial Si1-xGex deposition for embedded source/drain before and after millisecond laser anneal
Publication:
Stress characteritzation of selective epitaxial Si1-xGex deposition for embedded source/drain before and after millisecond laser anneal
Copy permalink
Date
2009
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
;
Fernandez Lanas, Tatiana
;
Rosseel, Erik
;
Hikavyy, Andriy
;
Dekkers, Harold
;
Eneman, Geert
;
Verheyen, Peter
;
Loo, Roger
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1815
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations
Metrics
Views
1815
since deposited on 2021-10-17
Acq. date: 2025-12-15
Citations