Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Test-station for flexible semi-automatic wafer-level silicon photonics testing
Publication:
Test-station for flexible semi-automatic wafer-level silicon photonics testing
Copy permalink
Date
2016
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Coster, Jeroen
;
De Heyn, Peter
;
Pantouvaki, Marianna
;
Snyder, Brad
;
Chen, Hongtao
;
Marinissen, Erik Jan
;
Absil, Philippe
;
Van Campenhout, Joris
;
Bolt, Bryan
Journal
Abstract
Description
Metrics
Views
1803
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1803
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations