Publication:

Test-station for flexible semi-automatic wafer-level silicon photonics testing

Date

2016
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorDe Heyn, Peter
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorSnyder, Brad
dc.contributor.authorChen, Hongtao
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorAbsil, Philippe
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorBolt, Bryan
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorDe Heyn, Peter
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.orcidimecDe Heyn, Peter::0000-0003-3523-7377
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.date.accessioned2021-10-23T10:24:57Z
dc.date.available2021-10-23T10:24:57Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26492
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7519306
dc.source.beginpage1
dc.source.conference21th IEEE European Test Symposium - ETS
dc.source.conferencedate24/05/2016
dc.source.conferencelocationAmsterdam Netherlands
dc.source.endpage6
dc.title

Test-station for flexible semi-automatic wafer-level silicon photonics testing

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions