Investigation of Vacancies Transport in the Bilayer of the Cu2O1-x/CuO1-y Resistive Switching Device and Effect of Growth Temperature on Memristive Switching

Publication:

2023

Journal article

Author(s)

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ACS APPLIED ELECTRONIC MATERIALS

893 since deposited on 2024-01-11

2last month

Acq. date: 2026-04-07