Publication:
Bias Temperature Instability (BTI) in high-mobility channel devices: SiGe, Ge, and InGaAs
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1981 since deposited on 2021-10-23
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Acq. date: 2026-01-11
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1981 since deposited on 2021-10-23
1last month
1last week
Acq. date: 2026-01-11
Citations