Publication:
Advanced electrical characterization toward (sub) 1nm EOT HfSiON – hole trapping in PFET and L-dependent effects
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1909 since deposited on 2021-10-16
Acq. date: 2026-07-26
Citations
Statistics
Views
1909 since deposited on 2021-10-16
Acq. date: 2026-07-26
Citations