Publication:
Advanced electrical characterization toward (sub) 1nm EOT HfSiON – hole trapping in PFET and L-dependent effects
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1905 since deposited on 2021-10-16
2last month
Acq. date: 2026-01-11
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Metrics
Views
1905 since deposited on 2021-10-16
2last month
Acq. date: 2026-01-11
Citations